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Publications
Allise
Wachs Publications
“A
Doe Primer” Fabricating & Metalworking.
Interview by Tim Heston, March, 2006.
“Capability
Indices Can Deceive” Manufacturing
Engineering, November, 2005.
“Just
the Right Size.” Fabricating
& Metalworking. Interview
by Phil Waters, August 26, 2005.
“Do
You Use SPC Correctly? Misapplication of Statistical Process Control can Damage Your
Operations.” Manufacturing
Engineering, March, 2005 Vol. 134 No. 3.
Made
in the USA: Eliminating Inefficiencies—Not US Profits!
A book.
Submitted, 2005.
“Accounting
for Risk Exposure in Failure Rate Analysis.” Michigan
Defense Quarterly, submitted 2005.
“Optimal
Decision Sequences for Stochastic Infinite Horizon Problems,”
(with I.E. Schochetman and R.L. Smith), submitted to Operations
Research, 2005.
“Design
of Experiments II.”
Textbook for a 32 hour course published and copyrighted
by Integral Concepts, Inc., 2003.
“Analysis
of Beryllium Lymphocyte Proliferation Test using Statistical
Process Control.”
Technical Report Exponent Health Group (with Daniel Cher),
2002.
“Design
of Experiments I: A First Course.”
Text for a 32 hour course published and copyrighted by
Integral Concepts, Inc., 2002.
“Statistical
Process Control I: A
First Course.”
Text for a 32 hour course published and copyrighted by
Integral Concepts, Inc., 2002.
“Statistical
Process Control II.”
Text for a 32 hour course published and copyrighted by
Integral Concepts, Inc., 2002.
“Statistical
Analysis for Process Improvement.”
Text for a 32 hour course published and copyrighted (with Steven
Wachs) by Integral Concepts, Inc., 2002.
“Measurement
System Assessment.”
Text for a 16 hour course published and copyrighted by
Integral Concepts, Inc., 2002.
“Analysis
of the Relationship Between Passenger Vehicle Weight and the
Risk of Traffic Fatality and Injury,”
prepared for General Motors Corporation for CAFÉ legislation
(with R. Ray, K. Ramachandran, and A. Donelson), April 2001.
“Reliability
Analysis.”
Seminar book for a 16 hour course published and
copyrighted by MRI, April 2000.
“Stochastic
Infinite Horizon Optimization with Average Cost Criterion,”
Ph.D. Thesis, University of Michigan, Ann Arbor, MI, 1998.
“Quantifying
the Number of Probes for Testing Route Guidance Systems,”
Transportation Research Board, (with S. Underwood), 1994.
“The
Expected Value of Perfect Information: Applications to Route
Guidance and Traffic Control,”
IVHS Technical Report 93-06, June 1993 (with R.L. Smith).
Steven
Wachs Publications
“Capability
Indices Can Deceive.” Manufacturing
Engineering, November 2005 Vol. 135, No. 5.
“Introduction
to Quality: Concepts and Methods”,
Textbook for an 8-hour course published and copyrighted by a
client of Integral Concepts, Inc., 2005.
“Regression
Analysis”, Textbook
for an 8-hour course published and copyrighted by Integral
Concepts, Inc., 2005.
Patent:
Method For Analyzing Warranty Claim Data, assigned
to Ford Motor Company, 2004.
“Reliability
Analysis”, Textbook
for a 32-hour course published and copyrighted by Integral
Concepts, Inc., 2003.
“Statistics,
Hypothesis Testing, & Regression”,
Textbook for a 32 hour course published and copyrighted by
Integral Concepts, Inc., 2003.
“Variation
& Statistics”,
Textbook for a 16-hour course published and copyrighted by
Integral Concepts, Inc., 2004.
Vijay
Nair Publications
S. Dass and V.
Nair (2003) "Edge-Detection, Spatial Smoothing and Image
Reconstruction with Partially Observed Multivariate Data," Journal
of the American Statistical Association, Vol. 98, pp. 77-89.
V. Nair, L.
Escobar, and M. Hamada (2003) "Design and Analysis of
Experiments for Reliability Assessment and Improvement,"
Chapter in Mathematical Reliability: An Expository
Perspective, edited by Mazzuchi, Singpurwaala, and Soyer,
Kluewer Academic Publishers (to appear).
V. Nair and L.
Xu (2002) "Optimal Design of Experiments for Modeling
Processes with Feedback Control Variables,"
Journal of Statistical Planning and Inference Vol. 113,
pp. 269-284.
V. Nair, W.
Taam and Q. Ye (2002) "Analysis of Functional Responses
from Robust Design Experiments,"
Journal of Quality Technology pp 355-370.
W. Jiang, H.
Wu, F. Tsung, V. Nair, and K. Tsui (2002) "PID-Based
Control Charts for Process Monitoring," Technometrics Vol.
44, pp. 204-215.
W. Brenneman
and V. Nair (2001) "Methods for Identifying Dispersion
Effects in Unreplicated Factorial Experiments:
A Critical Analysis and Proposed Strategies," Technometrics
, Vol.43, pp 388-405.
V. Nair, B.
Tang, and L. Xu (2001) "Bayesian Inference for Some Mixutre
Models in Reliability," Journal of Quality Technology
Vol.33, pp. 16-27.
V. Nair, M.
Hansen, and J. Shi (2000) "Statistics in Advanced
Manufacturing," JASA pp. 1002-1005.
F. Tsung, H.
Wu, and V. Nair (1998) "On the Efficiency and Robustness of
Discrete Proportional-Integral Control Schemes" Technometrics
, Vol.40, pp. 214-220.
V. Nair, D.
James, W. Ehrlich, J. Zevallos, J. (1998), "A Statistical
Assessment of Some Software Testing Strategies and Application
of Experimental Design Techniques," Statistica Sinica
pp. 165-184.
J. Bérubé and
V. Nair (1998) "Exploiting the Inherent Structure in Robust
Parameter Design Experiments, Statistica Sinica, pp.
43-66.
W. Ehrlich, V.
Nair, M. Alam, W. Chen. and M. Engel, (1998) "Software
Reliability Assessment Using Accelerated Testing Methods,"
Journal of the Royal Statistics Society, Series C -- Applied
Statistics, pp. 15-30.
O. Patterson,
P. Khargonekar, D. Grimard, X. Dong, and V. Nair (1997)
"Empirical Modeling of Reactive Ion Etching for Reduction
of Variance via Robust Design, Real-Time Feedback and Run-to-Run
Control," The Proceedings of the Second International
Symposium on Process Control, Diagnostics, and Modeling in
Semiconductor Manufacturing, edited by M. Meyyappan, D.J.
Economou and S.W.Butler, Vol. 97-9, The Electrochemical Society,
Inc., pp. 45-54.
M. Hansen, V.
Nair, and D. Friedman (1997) "Monitoring Wafer Map Data in
Integrated Circuit Fabrication for Spatially Clustered
Defects," Technometrics, Vol.39, pp 241-253.
M. Lunani, V.
Nair, and G. Wasserman (1997) "Graphical Methods for Robust
Design with Dynamic Characteristics," Journal of Quality
Technology Vol 29, pp. 327-338.
D. Friedman, M.
Hansen, V. Nair, and D. James (1997) "Model-Free Estimation
of Defect Clustering in Integrated Circuit Fabrication," IEEE
Transactions on Semiconductor Manufacturing, Vol.10, pp.
344-359
Edward
Rothman Publications
Estimation of
phylogenetic relationships for DNA restriction patterns and
selection endonuclease Rest. Sites, (with J. Adams). (1982) Proceedings
of the National Academy, U.S.A. 79.
Statistics:
Methods and applications, (with W. A. Ericson). (1st Edition,
1982; 2nd Edition, 1987) Kendall/Hunt Publishing Co.,
Dubuque, Iowa.
A model of weak
selection in the infinite alleles framework, (with N. C. Weber).
(1986) Journal of Mathematical Biology 24 353-360.
A revised
indirect estimate of mutation rates in Amerindians, (with J. V.
Neel, H. W. Mohrenweiser, and J. M. Naidu). (1986) American
Journal of Human Genetics 38 649-666.
Distributions
on partitions, (with R. W. Keener and N. Starr). (1987) Annals
of Statistics 15 1466-1481.
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